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Real-time Falling Particle Monitor APMON

Real-time Falling Particle MonitorAPMON

Continuously monitors
fallen and deposited particles

  • ISO14644-17

Monitors particle deposition real-time
Calculates the direct threat of particle deposition
onto products and environments

OVERVIEW

With the demand for a clean manufacturing environment in various industries, controlling particle contamination remains an eternal challenge for many companies. The contamination caused by particle deposition cannot be controlled by air particle counters nor with microscopic analysis. The key to reduce the risk of contamination is to know "when" and "how" the particles generated.

PRODUCT

APMON continually monitors the moments of increase in particle generation (particle events). These unwanted events are the result of inappropriate behaviors of personnel, systems, and cleaning.

Technical Characteristics

Measurement Technology and Related Standards
ISO14644-17
Measurement Range
15 - 1000µm
Measurement Principle
Large detection area, Laser holographic method
The wavy laser beam diffracted through the particle surface detects its shape from its waveform. The detected and recorded particle is shown as a 3 dimensional image by the diffraction pattern using the Fourier transform method. The result is the particle size distribution of the deposited particles from the previous measurement. (5 minutes ago)
APMON should be placed in close proximity to a manufacturing process to allow for real-time monitoring of depositing macroparticles that are risks to the product quality. By measuring particles of ≥15µm every 5 minutes, it detects “when,” “who/what,” and “how” particle generated.
Displaying Results
Detects inappropriate behavior at a minimum of 5 minutes interval.
The new monitoring technology for contamination risk assessment in clean environments.
APMON continuously monitors the moments of increase in particle generation (particle events). Inappropriate behaviors of personnel, systems, and cleaning are the main cause of these particle events. Monitoring particles 5µm or larger to riduce the risk particles and to improve contamination control has been standardized in ISO14644-17. APMON detects particles of 15µm or larger, the size of particles that fall and deposit in the air at the rate of 50% or higher.
Particle event against time Particle event against time
Analyze and evaluate the particle size distribution of falling particles for cleaner production lines
APMON displays the total number of macroparticles fallen onto the cartridge as shown on the graph. Particle sizes of 15-30µm are mostly human skin fragments and cellulose fragments, and 100µm or more are clothing fibers. Particles below 30µm may be removed by airflow,
though it requires improvements of entry/exit procedures at production sites as well as activity restrictions. Cleaning methods should be revised to achieve a cleaner production environment if particles larger than 50µm are being detected.
Particle size distribution Particle size distribution
Application
Assessment of PDR to control macroparticles
APMON calculates PDR by monitoring the changes in concentration, the size distribution of macroparticle, and the obscuration rate of the exposed area. The data helps to set the acceptable contamination level for products. (i.e. the number of particles/the area of exposure) When PDR exceeds the acceptable contamination level, assess and apply changes to risk factors such as the behavior of personnel and systems, surface contact, and surface cleanliness to achieve lower PDR. Reducing particle concentration on surfaces using PartSens while re-establishing procedures with APMON is the solution for controlling macroparticles.
Visualize particle generation and carry-over through numbers. Visualize particle generation and carry-over through numbers.
Accessories
  • Detection cartridge (1 x used at shipping verification x 1, 5 x spare)
  • Battery for sensor
  • Battery charger
  • Various power adapters
  • Various cables
Options
  • Display
  • Mouse
  • Keyboard
Specification

Sensor

Detectable particle sizes 15 - 1000µm
Detection surface area 25cm2 (4.2cm2×6)
PDR 99% Confidence interval ±6% (long term)
Measuring interval 5 minutes (with Ethernet connected)
Size 390×80×150mm (15.4×3.1×5.9in)
Weight Approximately 5kg (battery included)
Power Adapter 100-240V AC / 9V DC 550mA or Battery 7.2V / 7.8Ah
Batteries Rechargeable Lithium-ion battery
Number of batteries 2 per sensor
Battery Usage time Approx. 4 days (depending on measuring interval)
Communication base unit Ethernet or Bluetooth 2.0
(approx. 15 - 20m depending on measuring environment)
Optical light source 20mA Laser Diode 406nm
Principal Holographic imaging
Laser safety classification 2m according to IEC60825-1
Calibration Production approved, once a year
Environment (operating) 10℃ to 35℃ (50℉ to 95℉)
10 to 90% relative humidity, non-condensing

Detection Cartridge

Material Plastic and glass
Duration in use Max. of 3 months, depending on the condition of the cleanroom
Size 254×74×45mm (10.0×10.0×1.7in)
Packaging Packed in two bags in a controlled environment
Replacement Warning by software

Base Unit

Maximum number of sensors 2
Wireless communication Max. of 2 sensors
Batteries / Charger 〇
USB Data Output (CSV) 〇
Travel case 〇
Monitor, Keyboard, Mouse Optional
More Information

More Details

What are the applications of “the Particle Deposition Rate”
for cleanroom quality monitoring?

Aside from counting the number of particles for each particle 15 to 1000µm in real-time, APMON calculates the number of accumulated particles over a certain period of time.

PDR ＝ Number of Particles(≥Dµm) / Area(1dm2) / Time(1hour)

The PDR is the rate of deposition of particles onto surfaces and can be calculated as the change of surface particle concentration per m2 during the time of exposure in hours. ISO14644 and other European quality standards recognize PDR as the risk assessment method for monitoring and controlling macroparticles.

Control the risks of contamination with Particle Deposition Rate Limits Control the risks of contamination with Particle Deposition Rate Limits

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